OV-TEST-INDEX · v1.1 · 2026-09-27Download PDF
DoctypeIndex
Doc idOV-TEST-INDEX
Product lineopenvvvf
Applies toopenvvvf-control-module, chassis-size-2
Version1.1
Date2026-09-27
DescriptionFormal test reports and validation evidence for OpenVVVF hardware, firmware, and integration.
Nav order340

Testing and Validation

This section contains formal test records and validation evidence. Each document is evidence that a specific feature, requirement, or hazard mitigation was exercised.

All hardware power tests follow the shared definitions and evidence requirements of the Hardware Test Methodology — steady-state criteria, calculated quantities (P/Q/PF/efficiency), reconciliation rules, and naming.

Test evidence dashboard

Hardware

Test ID Name Motor class Status Trace Report
1 PMSM Resistance Calibration Validation PMSM draft motor self-commissioning / calibration routine Report
2 PMSM Inductance Calibration Validation PMSM draft motor self-commissioning / calibration routine Report
3 Power Resistor Sanity Check - draft motor self-commissioning / calibration routine Report
4 Induction Motor Testbed Induction draft motor self-commissioning / calibration routine Report
5 Induction Motor Resistance Calibration Validation Induction draft motor self-commissioning / calibration routine Report
6 Inductance Calibration Validation Induction draft motor self-commissioning / calibration routine Report
7 Induction Motor 1-Hour No-Load Test Induction draft gate-driver switching / thermal baseline Report
8 Induction Motor 180 V Power Stage Bring-up Induction draft power-stage bring-up at elevated bus voltage Report
9 Induction Motor 180 V 20-Minute Reversal Test Induction draft direction-change sequencing / current control Report
10 Motor Self-Commissioning Accuracy Report PMSM + Induction draft motor self-commissioning / calibration routine Report
11 Gen7 Board Temperature Sensor Validation - draft board temperature sensing / ADC measurement chain (OV-TEST-HW-GEN7-TEMP-NTC-VALIDATION) Report
12 Low-Power Regen 100 A Phase-Current Endurance (No Cooling) Induction draft high-current regen endurance / phase-current capability at low DC-bus voltage (no cooling) Report
13 200 A Regen to 79 °C — Gen7 Size 2 Induction draft high-current regen staircase; thermal rise with dry heatsink interface Report
14 Thermal OTP Trip — 200 A Regen, Gen7 Size 2 Induction draft overtemperature protection chain validation (trip at ~80 °C baseplate) Report
15 Initial 400 A Regen Test — Gen7 Size 2 Induction draft 400 A phase-current capability with bus clamp; current-clamp saturation identified as measurement artifact Report
16 450 A / 13 kW Regen — Gen7 Size 2 Induction draft 450 A phase-current capability at ~150 V clamp; OT trip reproduced Report
17 200 A Regen Steady-State Thermal Test — Gen7 Size 2 PMSM draft continuous-duty validation of the thermally-pasted interface (54.7 min, plateau 44.4/44.0 °C) Report
18 200 A Motoring Steady-State Thermal Test — Gen7 Size 2 PMSM draft motoring-direction counterpart of test 17 (42 min, plateau 43.6/43.5 °C) Report
19 300 A Regen Steady-State Thermal Test — Gen7 Size 2 PMSM draft 300 A continuous regen at ~2,600 RPM (22.9 min, 11.7 kW, plateau 63.2/61.7 °C; stopped on machine limit) Report
20 SSO Pathway Latency — Gen7 Size 2, Low Bus PMSM draft fault→six-switch-open latency (SG-03/SG-13, FSR-05): gate-driver fault ≤10 ms bound; ADC watchdog ISR break, bounded 30.3 A trip; physical pathways deferred Report
21 SSO Gate-Drive Kill Pathways — Gen7 Size 2, Low Bus PMSM draft Path 2a gate-power kill + Path 4 reset assertion (SG-03/SG-13, FSR-05): as-found no detection, gate-loss + TorqueLoss detectors added, retested to pass (flags ≤0.3 s) Report
22 Over-Torque Watchdog — 55 A Trip, Locked Rotor, Gen7 Size 2 PMSM draft SG-06/FSR-07: 110 %-of-calibrated-max over-torque chain implemented fix-forward; trip at 55.0 A vs 50 A max, 3× repeatable, SSO ≈0.6 ms, derived AWD backstop Report
23 Rotor Feedback Loss Detection — Gen7 Size 2, Low Bus PMSM draft SG-08/FSR-09: hard sin/cos disconnect at −2190 RPM → SSO µs–10 ms via all-channel AWD; blind-start defect fixed (start refusal), Critical EncoderLoss chain added; layered detection documented Report
24 DC-Link OV/UV Protection — Threshold Injection, Gen7 Size 2 PMSM draft SG-10/FSR-11/FSR-21: all four transitions validated at 49 V by threshold injection; OV-warning regen-disable + UV derate implemented fix-forward; critical OV/UV SSO ≪50 ms; FSR-21 candidate thresholds recorded Report
25 DESAT / Gate-Driver FLT Protection — Pulse Injection, Gen7 Size 2 PMSM draft SG-12/SG-14/FSR-13: 50 V ≥800 A no-DESAT bound; 100 V winding pulses → driver /FLT; FLT→MCU blindness (missing BIE/NVIC) fixed, latched PwmBreak + SSO verified; coproc FLT path open Report

These reports validate the calibration routines on the C2 test fixture. The same routines are used on all OpenVVVF chassis; add a new report only when a different motor or harness is introduced.

Safety-mechanism validation

Test ID Name Scope Status Trace Plan
- Fault-Injection Test Plan component / system / integration / environmental fault injection (control module + power stage) planned HARA safety goals, FSRs, hazards Plan
- Vibration Test Plan mechanical/environmental random vibration (control module + C2 power stage assembly) planned HARA failure modes relying on connectors/harness; fault-injection E-01 Plan
- Thermal Test Plan hardware thermal characterization + firmware thermal behavior (FSR-08 derate/SSO), C2 power stage planned OV-C2-DD-THERMAL, OV-C2-DD-DCLINK-THERMAL, FSR-08 Plan

The fault-injection plan spans all test domains, so it is filed directly under Testing. Execution campaigns produce dated test reports filed as siblings of the plan, referencing it by test ID.

Domains

Documents are filed by what is being tested, not by what equipment the bench uses:

  • Hardware - The DUT is physical hardware: power-stage bring-up, thermal, and bench characterization. Firmware-routine validations whose error budget is power-stage physics (e.g. motor self-commissioning calibrated against instruments) also live here.
  • Firmware - The DUT is control-module firmware logic: unit tests and host- or bench-based tests that do not inject physical faults.
  • Integration - System-level tests combining control module and power stage.